A new edge detector based on Fresnel diffraction

Authors:
Luhong Diao;Bin Yu;Hua Li
Affiliations:
Key Lab of Intelligent Information Processing, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China and Graduate University, Chinese Academy of Sciences, Beijing, China;Institute of Optoelectronics, Shenzhen University, Shenzhen, China;Key Lab of Intelligent Information Processing, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China
Venue:
Pattern Recognition Letters
Year:
2007

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Abstract

This paper proposed an edge detection scheme which is deduced from Fresnel diffraction. Analysis in this paper shows that Fresnel convolution kernel function performs well on edge enhancement when images are transformed into complex functions. Due to its mathematical complexity, the method is simplified into a linear convolution filter. The new edge detector is designed based on the simplified linear filter. Experimental results indicate that the new detector gives quantitative results equal to the Canny detector while it is more simple to be implemented.