New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge

  • Authors:
  • Pamela Viale;Claudia Frydman;Jacques Pinaton

  • Affiliations:
  • LSIS, Laboratoire des Sciences de l'Information et des Systèmes, Université Aix-Marseille III, France;LSIS, Laboratoire des Sciences de l'Information et des Systèmes, Université Aix-Marseille III, France;STMicroelectronics, Rousset, France

  • Venue:
  • AICCSA '11 Proceedings of the 2011 9th IEEE/ACS International Conference on Computer Systems and Applications
  • Year:
  • 2011

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Abstract

Modeling manufacturing process of complex products like electronic chips is crucial to maximize the quality of the production. This paper proposes a new methodology to model large scale manufacturing processes based on activity information as well as experts' knowledge. DEVS formalism is used for the final models because of its advantages as a formal formalism. This methodology helps to easily detect discrepancies between the actual implementation of processes with experts' definitions. It also helps to construct general models that could be used later for controlling processes. The idea of STMicroelectronics enterprise is to use these general models to implement an alarm system. The idea is to alert engineers about risky modifications done over STMicroelectronics manufacturing processes. The state of our work towards to model STMicroelectronics' production processes is presented at the end of this paper.