Symmetric surface-feature based 3D face recognition for partial data

  • Authors:

  • Dirk Smeets;Johannes Keustermans;Jeroen Hermans;Peter Claes;Dirk Vandermeulen;Paul Suetens

  • Affiliations:

  • K.U.Leuven, ESAT-PSI, IBBT-K.U.Leuven Future Health Department, Medical Imaging Research Center, University Hospitals Gasthuisberg, Herestraat 49 - bus 7003, B-3000, Belgium;K.U.Leuven, ESAT-PSI, IBBT-K.U.Leuven Future Health Department, Medical Imaging Research Center, University Hospitals Gasthuisberg, Herestraat 49 - bus 7003, B-3000, Belgium;K.U.Leuven, ESAT-PSI, IBBT-K.U.Leuven Future Health Department, Medical Imaging Research Center, University Hospitals Gasthuisberg, Herestraat 49 - bus 7003, B-3000, Belgium;K.U.Leuven, ESAT-PSI, IBBT-K.U.Leuven Future Health Department, Medical Imaging Research Center, University Hospitals Gasthuisberg, Herestraat 49 - bus 7003, B-3000, Belgium;K.U.Leuven, ESAT-PSI, IBBT-K.U.Leuven Future Health Department, Medical Imaging Research Center, University Hospitals Gasthuisberg, Herestraat 49 - bus 7003, B-3000, Belgium;K.U.Leuven, ESAT-PSI, IBBT-K.U.Leuven Future Health Department, Medical Imaging Research Center, University Hospitals Gasthuisberg, Herestraat 49 - bus 7003, B-3000, Belgium

  • Venue:
  • IJCB '11 Proceedings of the 2011 International Joint Conference on Biometrics
  • Year:
  • 2011

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Abstract

Since most 3D cameras cannot capture the complete 3D face, an important challenge in 3D face recognition is the comparison of two 3D facial surfaces with little or no overlap. In this paper, a local feature method is presented to tackle this challenge exploiting the symmetry of the human face. Features are located and described using an extension of SIFT for meshes (meshSIFT). As such, features are localized as extrema in the curvature scale space of the input mesh, and are described by concatenating histograms of shape indices and slant angles of the neighborhood. For 3D face scans with sufficient overlap, the number of matching meshSIFT features is a reliable measure for face recognition purposes. However, as the feature descriptor is not symmetrical, features on one face are not matched with their symmetrical counterpart on another face impeding their feasibility for comparison of face scans with limited or no (left-right) overlap. In order to alleviate this problem, facial symmetry could be used to increase the overlap between two face scans by mirroring one of both faces w.r.t. an arbitrary plane. As this would increase the computational demand, this paper proposes an efficient approach to describe the features of a mirrored face by mirroring the mesh-SIFT descriptors of the input face. The presented method is validated on the data of the "SHREC '11: Face Scans" contest, containing many partial scans. This resulted in a recognition rate of 98.6% and a mean average precision of 93.3%, clearly outperforming all other participants in the challenge.