Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures

Authors:
Shyam Kumar Devarakond;Shreyas Sen;Soumendu Bhattacharya;Abhijit Chatterjee
Affiliations:
Georgia Institute of Technology , Atlanta,;Intel Circuit Research Lab , Hillsboro,;Texas Instruments, Dallas,;Georgia Institute of Technology, Atlanta,
Venue:
IEEE Design & Test
Year:
2012

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Abstract

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