Stitching line and deformation propagation for seamless image stitching

Authors:
Chunxiao Bian;Chuangbai Xiao;Huiqin Xi;Yi Liu
Affiliations:
Beijing University of Technology, Beijing, China;Beijing University of Technology, Beijing, China;Beijing University of Technology, Beijing, China;Beijing University of Technology, Beijing, China
Venue:
Proceedings of the 27th Conference on Image and Vision Computing New Zealand
Year:
2012

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Abstract

This paper presents an approach to determine the optimal stitching line and propagate deformation in irregular overlap for image stitching. First, determine the optimal stitching line that has the lowest cost of some candidate lines in the irregular region; second, detect and match the features in the neighborhood of the optimal stitching line and calculate deformation vectors; finally, spread the deformation vectors to the whole of image region by Poisson equation and constitute the image gradient field that can reconstruct seamless mosaic. This method has no limitation to the shape of the overlapping area so can reduce the juncture of structure and color in the stitching images. Compared with other methods this method can achieve better visual results both in structure and color.