Entropic selection of histogram features for efficient classification

Authors:
Ákos Utasi
Affiliations:
Computer Automation Research Institute, Hungarian Academy of Sciences, Budapest, Hungary
Venue:
SSPR'12/SPR'12 Proceedings of the 2012 Joint IAPR international conference on Structural, Syntactic, and Statistical Pattern Recognition
Year:
2012

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Abstract

This paper addresses the problem of local histogram-based image feature selection for learning binary classifiers. We show a novel technique which efficiently combines histogram feature projection with the conditional mutual information (CMI) based classifier selection scheme. Moreover, we investigate cost-sensitive modifications of the CMI-based selection procedure, which further improves the classification performance. Extensive evaluations show that the proposed methods are suitable for object detection and recognition tasks.