Improving fault tolerance utilizing hardware-software-co-synthesis
Proceedings of the Conference on Design, Automation and Test in Europe
Hi-index | 0.00 |
As transistor geometry shrinks, the erroneous and spurious charge from a particle strike tends to be shared by multiple nodes and causes multiple nodes upset. Such SEU mechanism invalidates the hardening principle of protecting a single node in relatively larger technologies. SEU needs to be accordingly understood and evaluated. In an 28-nm design example, SEU can happen in 6-day interval if no mitigation technique is used.