Silicon physical random functions
Proceedings of the 9th ACM conference on Computer and communications security
High-performance CMOS variability in the 65-nm regime and beyond
IBM Journal of Research and Development - Advanced silicon technology
Physical unclonable functions for device authentication and secret key generation
Proceedings of the 44th annual Design Automation Conference
Temperature-aware cooperative ring oscillator PUF
HST '09 Proceedings of the 2009 IEEE International Workshop on Hardware-Oriented Security and Trust
Secure and Robust Error Correction for Physical Unclonable Functions
IEEE Design & Test
Novel physical unclonable function with process and environmental variations
Proceedings of the Conference on Design, Automation and Test in Europe
Design and implementation of a group-based RO PUF
Proceedings of the Conference on Design, Automation and Test in Europe
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Silicon physical unclonable functions (PUF) utilize fabrication variation to extract information that will be unique for each chip. However, fabrication variation has a very strong spatial correlation and thus the PUF information will not be statistically random, which causes security threats to silicon PUF. We propose to decouple the unwanted systematic variation from the desired random variation through a regression-based distiller. In our experiments, we show that information generated by existing PUF schemes fail to pass NIST randomness test. However, our proposed method can provide statistically random PUF information and thus bolster the security characteristics of existing PUF schemes.