A comparative study of 20-Gb/s NRZ and duobinary signaling using statistical analysis

Authors:
Kangmin Hu;Larry Wu;Patrick Yin Chiang
Affiliations:
School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR;Montage Technology, Shanghai, China;School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR
Venue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year:
2012

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Abstract

A statistical analysis technique for estimating bit-error rate (BER) and eye opening is presented for both non-return-to-zero (NRZ) and duobinary signaling schemes. This method enables fast and accurate BER distribution simulation of a serial link transceiver including channel and circuit imperfections, such as finite pulse rise/fall time, duty cycle variation and both receiver and transmitter forwarded-clock jitter. Acomparison between 20-Gb/s NRZ and duobinary transmitters using this simulator shows that while duobinary transmission relaxes the requirements on the receiver equalizer due to the lower Nyquist frequency of the transmitted data, significant eye-opening and BER degradation can arise from clock non-idealities. The proposed statistical analysis is verified against traditional time-domain, transient eye-diagram simulations at 20-Gb/s, transmitted through measured s-parameter channel characteristics.