RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits
ATS '04 Proceedings of the 13th Asian Test Symposium
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources
VTS '09 Proceedings of the 2009 27th IEEE VLSI Test Symposium
Detailed characterization of transceiver parameters through loop-back-based BiST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Compensation schemes and performance analysis of IQ imbalances in OFDM receivers
IEEE Transactions on Signal Processing - Part II
Advanced methods for I/Q imbalance compensation in communicationreceivers
IEEE Transactions on Signal Processing
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Loop-back is a desirable test set-up for RF transceivers for both on-chip characterization and production testing. Measurement of IQ imbalances (phase mismatch, gain mismatch, DC offset, and time skews) in the loop-back mode is challenging due to the coupling between the receiver (RX) and transmitter (TX) parameters. We present an analytical method for the measurement of the imbalances in the loop-back mode. We excite the system with carefully designed test signals at the baseband TX input and analyze the corresponding RX baseband output. The derived and used mathematical equations based on these test inputs enable us to unambiguously compute IQ mismatches. Experiments conducted both in simulations and on a hardware platform confirm that the proposed technique can accurately compute the IQ imbalances.