A 13-bit noise shaping SAR---ADC with dual-polarity digital calibration

  • Authors:
  • Hangue Park;Maysam Ghovanloo

  • Affiliations:
  • School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA 30308;School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA 30308

  • Venue:
  • Analog Integrated Circuits and Signal Processing
  • Year:
  • 2013

Quantified Score

Hi-index 0.00

Visualization

Abstract

We present a new noise shaping method and a dual-polarity calibration technique suited for successive approximation register type analog to digital converters (SAR---ADC). Noise is pushed to higher frequencies with the noise shaping by adding a switched capacitor. The SAR capacitor array mismatch has been compensated by the dual-polarity digital calibration with minimum circuit overhead. A proof-of-concept prototype SAR---ADC using the proposed techniques has been fabricated in a 0.5-μm standard CMOS technology. It achieves 67.7 dB SNDR at 62.5 kHz sampling frequency, while consuming 38.3 μW power with 1.8 V supply.