Impulse response fault model and fault extraction for functional level analog circuit diagnosis

Authors:
Chauchin Su;Shenshung Chiang;Shyh-Jye Jou
Affiliations:
Department of Electrical Engineering, National Central University, Chung-Li, Taiwan 32054, R.O.C.;Department of Electrical Engineering, National Central University, Chung-Li, Taiwan 32054, R.O.C.;Department of Electrical Engineering, National Central University, Chung-Li, Taiwan 32054, R.O.C.
Venue:
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Year:
1995

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Abstract

In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.