The complexity of data flow criteria for test data selection
Information Processing Letters
Selecting Software Test Data Using Data Flow Information
IEEE Transactions on Software Engineering
An Applicable Family of Data Flow Testing Criteria
IEEE Transactions on Software Engineering
Reducing the effects of infeasible paths in branch testing
TAV3 Proceedings of the ACM SIGSOFT '89 third symposium on Software testing, analysis, and verification
The Cost of Data Flow Testing: An Empirical Study
IEEE Transactions on Software Engineering
Software testing techniques (2nd ed.)
Software testing techniques (2nd ed.)
Automated Software Test Data Generation
IEEE Transactions on Software Engineering
A methodology for controlling the size of a test suite
ACM Transactions on Software Engineering and Methodology (TOSEM)
Automatic Generation of Path Covers Based on the Control Flow Analysis of Computer Programs
IEEE Transactions on Software Engineering
Effect of test set minimization on fault detection effectiveness
Proceedings of the 17th international conference on Software engineering
How many paths are needed for branch testing?
Journal of Systems and Software - Special issue on software reliability issues
Experiments of the effectiveness of dataflow- and controlflow-based test adequacy criteria
ICSE '94 Proceedings of the 16th international conference on Software engineering
A fast algorithm for finding dominators in a flowgraph
ACM Transactions on Programming Languages and Systems (TOPLAS)
Flow Analysis of Computer Programs
Flow Analysis of Computer Programs
An Experimental Comparison of the Effectiveness of Branch Testing and Data Flow Testing
IEEE Transactions on Software Engineering
Graphs and Hypergraphs
Reducing and estimating the cost of test coverage criteria
Proceedings of the 18th international conference on Software engineering
Using Spanning Sets for Coverage Testing
IEEE Transactions on Software Engineering
Integrating automated test generation into the WYSIWYT spreadsheet testing methodology
ACM Transactions on Software Engineering and Methodology (TOSEM)
Efficiently monitoring data-flow test coverage
Proceedings of the twenty-second IEEE/ACM international conference on Automated software engineering
Using model checking for reducing the cost of test generation
FATES'04 Proceedings of the 4th international conference on Formal Approaches to Software Testing
Dependence testing: extending data flow testing with control dependence
TestCom'05 Proceedings of the 17th IFIP TC6/WG 6.1 international conference on Testing of Communicating Systems
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Testing takes a considerable amount of the time and resources spent on producing software. It would therefore be useful to have ways 1) to reduce the cost of testing and 2) to estimate this cost. In particular, the number of tests to be executed is an important and useful attribute of the entity "testing effort". All-uses coverage is a data flow testing strategy widely researched in recent years. In this paper we present spanning sets of duas for the all-uses coverage criterion. A spanning set of duas is a minimum set of duas (definition-use associations) such that a set of test paths covering them covers every dua in the program. We give a method to find a spanning set of duas using the relation of subsumption between duas. Intuitively, there exists a natural ordering between the duas in a program: some duas are covered more easily than others, since coverage of the former is automatically guaranteed whenever the latter are covered. Those duas that are the most difficult to be covered according to this ordering are called unconstrained. A spanning set of duas is composed of unconstrained duas. Our results are useful for reducing the cost of testing, since the generation of test paths can be targeted to cover the smaller spanning set of duas, rather than all those in a program. On the other hand, assuming that a different path is taken to cover each dua in a spanning set, the cardinality of spanning sets can be used to estimate the cost of testing. Other interesting uses of spanning sets of duas are also discussed.