Effect of test set minimization on fault detection effectiveness

  • Authors:
  • W. Eric Wong;Joseph R. Horgan;Saul London;Aditya P. Mathur

  • Affiliations:
  • Bell Communications Research, Morristown, NJ;Bell Communications Research, Morristown, NJ;Bell Communications Research, Morristown, NJ;Software Engineering Research Center, Department of Computer Sciences, Purdue University, W. Lafayette, IN

  • Venue:
  • Proceedings of the 17th international conference on Software engineering
  • Year:
  • 1995

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Abstract