The Combinatorial Design Approach to Automatic Test Generation

  • Authors:
  • David M. Cohen;Siddhartha R. Dalal;Jesse Parelius;Gardner C. Patton

  • Affiliations:
  • -;-;-;-

  • Venue:
  • IEEE Software
  • Year:
  • 1996

Quantified Score

Hi-index 0.00

Visualization

Abstract

The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.