A Test Generation Strategy for Pairwise Testing

  • Authors:
  • K. C. Tai;Y. Lie

  • Affiliations:
  • -;-

  • Venue:
  • IEEE Transactions on Software Engineering
  • Year:
  • 2002

Quantified Score

Hi-index 0.02

Visualization

Abstract

Pairwise testing is a specification-based testing criterion, which requires that for each pair of input parameters of a system, every combination of valid values of these two parameters be covered by at least one test case. In this paper, we propose a new test generation strategy for pairwise testing.