Test sets generation from algebraic specifications using logic programming
Journal of Systems and Software
Software testing based on formal specifications: a theory and a tool
Software Engineering Journal
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IEEE Transactions on Software Engineering - Special issue: best papers of the 1996 international symposium on software testing and analysis ISSTA'96
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Proceedings of the the 6th joint meeting of the European software engineering conference and the ACM SIGSOFT symposium on The foundations of software engineering
Directed test generation using symbolic grammars
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State of the art: Dynamic symbolic execution for automated test generation
Future Generation Computer Systems
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Given a grammar (or other sorts of meta-data), one can trivially derive combinatorially exhaustive test-data sets up to a specified depth. Without further efforts, such test-data sets would be huge at the least and explosive most of the time. Fortunately, scenarios of grammar-based testing tend to admit non-explosive approximations of naive combinatorial coverage. In this paper, we describe the notion of controllable combinatorial coverage and a corresponding algorithm for test-data generation. The approach is based on a suite of control mechanisms to be used for the characterization of test-data sets as well-defined and understandable approximations of full combinatorial coverage. The approach has been implemented in the C#-based test-data generator Geno, which has been successfully used in projects that required differential testing, stress testing and conformance testing of grammar-driven functionality.