In-Parameter-Order: A Test Generation Strategy for Pairwise Testing

  • Authors:

  • Yu Lei;Kuo-Chung Tai

  • Affiliations:

  • -;-

  • Venue:
  • HASE '98 The 3rd IEEE International Symposium on High-Assurance Systems Engineering
  • Year:
  • 1998

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Abstract

Pairwise testing (or 2-way testing) is a specification-based testing criterion, which requires that for each pair of input parameters of a system, every combination of valid values of these two parameters be covered by at least one test case. Empirical results show that pairwise testing is practical and effective for various types of software systems. In this paper, we show that the problem of generating a minimum test set for pairwise testing is NP-complete. We propose a test generation strategy, called in-parameter-order (or IPO), for pairwise testing. For a system with two or more input parameters, the IPO strategy generates a pairwise test set for the first two parameters, extends the test set to generate a pairwise test set for the first three parameters, and continues to do so for each additional parameter. The IPO strategy allows the use of local optimization techniques for test generation and the reuse of existing tests when a system is extended with new parameters or new values of existing parameters. We present practical, IPO-based test generation algorithms. We describe the implementation of an IPO-based test generation tool and show some empirical results.