The AETG System: An Approach to Testing Based on Combinatorial Design
IEEE Transactions on Software Engineering
Black-box test reduction using input-output analysis
Proceedings of the 2000 ACM SIGSOFT international symposium on Software testing and analysis
In-Parameter-Order: A Test Generation Strategy for Pairwise Testing
HASE '98 The 3rd IEEE International Symposium on High-Assurance Systems Engineering
Constructing test suites for interaction testing
Proceedings of the 25th International Conference on Software Engineering
Variable Strength Interaction Testing of Components
COMPSAC '03 Proceedings of the 27th Annual International Conference on Computer Software and Applications
Generating Small Combinatorial Test Suites to Cover Input-Output Relationships
QSIC '03 Proceedings of the Third International Conference on Quality Software
Journal of Combinatorial Theory Series B
Vector sets for exhaustive testing of logic circuits
IEEE Transactions on Information Theory
Constructions of (t ,m,s)-nets and (t,s)-sequences
Finite Fields and Their Applications
New bounds for binary covering arrays using simulated annealing
Information Sciences: an International Journal
Divisibility of polynomials over finite fields and combinatorial applications
Designs, Codes and Cryptography
Supercomputing and grid computing on the verification of covering arrays
The Journal of Supercomputing
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In the test suite generation (TSG) problem for software systems, I is a set of n input parameters where each I@?I has @k(I) data values, and O is a collection of subsets of I where the interactions of the parameters in each O@?O are thought to affect the outcome of the system. A test case for (I,O,@k) is an n-tuple (t"1,t"2,...,t"n) that specifies the value of each input parameter in I. The goal is to generate a smallest-sized test suite (i.e., a set of test cases) that covers all combinations of each O@?O. The decision version of TSG is known to be NP-complete. In this paper, we present new families of (I,O,@k) for which optimal test suites can be constructed efficiently. They differ from the ones already known by the way we characterize (I,O) and @k. We then use these instances to generate test suites for arbitrary software systems. When each O@?O has |O|=2, the sizes of the test suite are guaranteed to be at most @?log"2n@?xOPT, matching the current best bound for this problem. Our constructions utilize the structure of (I,O) and @k; consequently, the less ''complex''(I,O) and @k are, the better are the bounds on the sizes of the test suites.