The cell probe complexity of succinct data structures
Theoretical Computer Science
The test suite generation problem: Optimal instances and their implications
Discrete Applied Mathematics
A backtracking search tool for constructing combinatorial test suites
Journal of Systems and Software
Learning a circuit by injecting values
Journal of Computer and System Sciences
Covering arrays avoiding forbidden edges
Theoretical Computer Science
Upper bounds for covering arrays by tabu search
Discrete Applied Mathematics
Constructions of new orthogonal arrays and covering arrays of strength three
Journal of Combinatorial Theory Series A
Vertex Turán problems in the hypercube
Journal of Combinatorial Theory Series A
New bounds for binary covering arrays using simulated annealing
Information Sciences: an International Journal
Combining model-based and combinatorial testing for effective test case generation
Proceedings of the 2012 International Symposium on Software Testing and Analysis
Supercomputing and grid computing on the verification of covering arrays
The Journal of Supercomputing
T-wise combinatorial interaction test suites construction based on coverage inheritance
Software Testing, Verification & Reliability
Testers and their applications
Proceedings of the 5th conference on Innovations in theoretical computer science
Mixed optimization combinatorial method for constructing covering arrays
Programming and Computing Software
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(L, d)-universal sets are useful for exhaustively testing logic circuits with a large number of functional components, designed so that every functional component depends on at most d inputs. Randomized and deterministic constructions of ( L, d)-universal test sets are presented, and lower and upper bounds on the optimal sizes of such sets are proven. It is also proven that the design of an optimal exhaustive test set for an arbitrary logic circuit is an NP-complete problem