A new strategy for pairwise test case generation

Authors:
Yingxia Cui;Longshu Li;Sheng Yao
Affiliations:
Dept. of Computer Science and Technology, Anhui University, Hefei, China;Dept. of Computer Science and Technology, Anhui University, Hefei, China;Dept. of Computer Science and Technology, Anhui University, Hefei, China
Venue:
IITA'09 Proceedings of the 3rd international conference on Intelligent information technology application
Year:
2009

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Abstract

Pairwise testing has become an important approach to software testing because it often provides effective error detection at low cost, and a key problem of it is the test case generation method. As the part of an effort to develop an optimized strategy for pairwise testing, this paper proposes an efficient pairwise test case generation strategy, called VIPO(Variant of In-Parameter-order), which is a variant of IPO strategy. We compare its effectiveness with some existing strategies including IPO, Tconfig, Pict and AllPairs. Experimental results demonstrate that VIPO outperformed them in terms of the number of generated test case within reasonable execution times, in most cases.