IPOG: A General Strategy for T-Way Software Testing

Authors:
Yu Lei;Raghu Kacker;D. Richard Kuhn;Vadim Okun;James Lawrence
Affiliations:
University of Texas at Arlington, USA;National Inst. of Standards and Tech., USA;National Inst. of Standards and Tech., USA;National Inst. of Standards and Tech., USA;George Mason University, USA
Venue:
ECBS '07 Proceedings of the 14th Annual IEEE International Conference and Workshops on the Engineering of Computer-Based Systems
Year:
2007

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Abstract

Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In this paper, we generalize an existing strategy, called In-Parameter-Order (IPO), from pairwise testing to t-way testing. A major challenge of our generalization effort is dealing with the combinatorial growth in the number of combinations of parameter values. We describe a t-way testing tool, called FireEye, and discuss design decisions that are made to enable an efficient implementation of the generalized IPO strategy. We also report several experiments that are designed to evaluate the effectiveness of FireEye.