Orthogonal Latin squares: an application of experiment design to compiler testing
Communications of the ACM
Model-based testing in practice
Proceedings of the 21st international conference on Software engineering
Digital Design
A Test Generation Strategy for Pairwise Testing
IEEE Transactions on Software Engineering
An Investigation of the Applicability of Design of Experiments to Software Testing
SEW '02 Proceedings of the 27th Annual NASA Goddard Software Engineering Workshop (SEW-27'02)
Generating Test Cases for GUI Responsibilities Using Complete Interaction Sequences
ISSRE '00 Proceedings of the 11th International Symposium on Software Reliability Engineering
Proceedings of the 9th European software engineering conference held jointly with 11th ACM SIGSOFT international symposium on Foundations of software engineering
Efficient Evaluation of Multifactor Dependent System Performance Using Fractional Factorial Design
IEEE Transactions on Software Engineering
A Practitioner's Guide to Software Test Design
A Practitioner's Guide to Software Test Design
Software Fault Interactions and Implications for Software Testing
IEEE Transactions on Software Engineering
Software Testing, Verification & Reliability
MuJava: an automated class mutation system: Research Articles
Software Testing, Verification & Reliability
Covering Arrays for Efficient Fault Characterization in Complex Configuration Spaces
IEEE Transactions on Software Engineering
System-level Test and Validation of Hardware/Software Systems (Springer Series in Advanced Microelectronics)
IPOG: A General Strategy for T-Way Software Testing
ECBS '07 Proceedings of the 14th Annual IEEE International Conference and Workshops on the Engineering of Computer-Based Systems
Pseudo-Exhaustive Testing for Software
SEW '06 Proceedings of the 30th Annual IEEE/NASA Software Engineering Workshop
Practical Combinatorial Testing: Beyond Pairwise
IT Professional
IPOG-IPOG-D: efficient test generation for multi-way combinatorial testing
Software Testing, Verification & Reliability
Bytecode fault injection for Java software
Journal of Systems and Software
IRPS --- An Efficient Test Data Generation Strategy for Pairwise Testing
KES '08 Proceedings of the 12th international conference on Knowledge-Based Intelligent Information and Engineering Systems, Part I
A density-based greedy algorithm for higher strength covering arrays
Software Testing, Verification & Reliability
Iterative exhaustive pattern generation for logic testing
IBM Journal of Research and Development
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We propose a novel strategy to optimize the test suite required for testing both hardware and software in a production line. Here, the strategy is based on two processes: Quality Signing Process and Quality Verification Process, respectively. Unlike earlier work, the proposed strategy is based on integration of black box and white box techniques in order to derive an optimum test suite during the Quality Signing Process. In this case, the generated optimal test suite significantly improves the Quality Verification Process. Considering both processes, the novelty of the proposed strategy is the fact that the optimization and reduction of test suite is performed by selecting only mutant killing test cases from cumulating t-way test cases. As such, the proposed strategy can potentially enhance the quality of product with minimal cost in terms of overall resource usage and time execution. As a case study, this paper describes the step-by-step application of the strategy for testing a 4-bit Magnitude Comparator Integrated Circuits in a production line. Comparatively, our result demonstrates that the proposed strategy outperforms the traditional block partitioning strategy with the mutant score of 100% to 90%, respectively, with the same number of test cases.