Generative programming: methods, tools, and applications
Generative programming: methods, tools, and applications
IEEE Transactions on Software Engineering
Software Fault Interactions and Implications for Software Testing
IEEE Transactions on Software Engineering
Software Product Line Engineering: Foundations, Principles and Techniques
Software Product Line Engineering: Foundations, Principles and Techniques
Algorithmic construction of sets for k-restrictions
ACM Transactions on Algorithms (TALG)
IPOG: A General Strategy for T-Way Software Testing
ECBS '07 Proceedings of the 14th Annual IEEE International Conference and Workshops on the Engineering of Computer-Based Systems
IEEE Transactions on Software Engineering
Incremental covering array failure characterization in large configuration spaces
Proceedings of the eighteenth international symposium on Software testing and analysis
Automated analysis of feature models 20 years later: A literature review
Information Systems
Incremental Test Generation for Software Product Lines
IEEE Transactions on Software Engineering
Software product line testing - A systematic mapping study
Information and Software Technology
A survey of combinatorial testing
ACM Computing Surveys (CSUR)
Automated incremental pairwise testing of software product lines
SPLC'10 Proceedings of the 14th international conference on Software product lines: going beyond
Evaluating improvements to a meta-heuristic search for constrained interaction testing
Empirical Software Engineering
Properties of realistic feature models make combinatorial testing of product lines feasible
Proceedings of the 14th international conference on Model driven engineering languages and systems
Evolutionary algorithm for prioritized pairwise test data generation
Proceedings of the 14th annual conference on Genetic and evolutionary computation
A survey on software product line testing
Proceedings of the 16th International Software Product Line Conference - Volume 1
An algorithm for generating t-wise covering arrays from large feature models
Proceedings of the 16th International Software Product Line Conference - Volume 1
Towards efficient SPL testing by variant reduction
Proceedings of the 4th international workshop on Variability & composition
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Combinatorial Interaction Testing has shown great potential for effectively testing Software Product Lines (SPLs). An important part of this type of testing is determining a subset of SPL products in which interaction errors are more likely to occur. Such sets of products are obtained by computing a so called t-wise Covering Array (tCA), whose computation is known to be NP-complete. Recently, the ICPL algorithm has been proposed to compute these covering arrays. In this research-in-progress paper, we propose a set of rules that exploit basic feature model knowledge to reduce the number of elements (i.e. t-sets) required by ICPL without weakening the strength of the generated arrays. We carried out a comparison of runtime performance that shows a significant reduction of the needed execution time for the majority of our SPL case studies.