Generating Test Data with Enhanced Context-Free Grammars

  • Authors:
  • Peter M. Maurer

  • Affiliations:
  • -

  • Venue:
  • IEEE Software
  • Year:
  • 1990

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Abstract

The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.