Combining test case generation and runtime verification

Authors:
Cyrille Artho;Howard Barringer;Allen Goldberg;Klaus Havelund;Sarfraz Khurshid;Mike Lowry;Corina Pasareanu;Grigore Rosu;Koushik Sen;Willem Visser;Rich Washington
Affiliations:
Computer Systems Institute, ETH Zurich, Switzerland;School of Computer Science, University of Manchester, UK;Kestrel Technology;Kestrel Technology;UT ARISE, University of Texas at Austin;NASA Ames Research Center;Kestrel Technology, NASA Ames Research Center;Department of Computer Science, Univ. of Illinois at Urbana-Champaign;Department of Computer Science, Univ. of Illinois at Urbana-Champaign;RIACS, NASA Ames Research Center;RIACS, NASA Ames Research Center
Venue:
Theoretical Computer Science - Abstract state machines and high-level system design and analysis
Year:
2005

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Abstract

The background and the themes of this ASM-centered special issue of TCS are briefly described.