Generation of Positive and Negative Tests for Parsers

  • Authors:
  • S. V. Zelenov;S. A. Zelenova

  • Affiliations:
  • Institute for System Programming, Russian Academy of Sciences, Moscow, Russia 109004;Institute for System Programming, Russian Academy of Sciences, Moscow, Russia 109004

  • Venue:
  • Programming and Computing Software
  • Year:
  • 2005

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Abstract

A methodology for automatic positive and negative test set generation for testing parsers is described. Coverage criteria for such test sets based on the model approach to testing are proposed. Methods for the generation of test sets satisfying these criteria are discussed. Results of the application of the proposed methodology for testing parsers for various languages including C and Java are presented.