Automatic test generation for n-way combinatorial testing

Authors:
Changhai Nie;Baowen Xu;Liang Shi;Guowei Dong
Affiliations:
Dept. of Computer Sci. & Eng., Southeast University, Nanjing, China;Dept. of Computer Sci. & Eng., Southeast University, Nanjing, China;Dept. of Computer Sci. & Eng., Southeast University, Nanjing, China;Dept. of Computer Sci. & Eng., Southeast University, Nanjing, China
Venue:
QoSA'05 Proceedings of the First international conference on Quality of Software Architectures and Software Quality, and Proceedings of the Second International conference on Software Quality
Year:
2005

Citing 6
Cited 5

Orthogonal Latin squares: an application of experiment design to compiler testing

Communications of the ACM
The AETG System: An Approach to Testing Based on Combinatorial Design

IEEE Transactions on Software Engineering
The Combinatorial Design Approach to Automatic Test Generation

IEEE Software
A Test Generation Strategy for Pairwise Testing

IEEE Transactions on Software Engineering
Software Fault Interactions and Implications for Software Testing

IEEE Transactions on Software Engineering
Using Artificial Life Techniques to Generate Test Cases for Combinatorial Testing

COMPSAC '04 Proceedings of the 28th Annual International Computer Software and Applications Conference - Volume 01

Generating combinatorial test suite for interaction relationship

Fourth international workshop on Software quality assurance: in conjunction with the 6th ESEC/FSE joint meeting
A survey of combinatorial testing

ACM Computing Surveys (CSUR)
An open-source tool for automated generation of black-box xunit test code and its industrial evaluation

TAIC PART'10 Proceedings of the 5th international academic and industrial conference on Testing - practice and research techniques
Design and implementation of a t-way test data generation strategy with automated execution tool support

Information Sciences: an International Journal
The Minimal Failure-Causing Schema of Combinatorial Testing

ACM Transactions on Software Engineering and Methodology (TOSEM)

Quantified Score

Hi-index	0.00

Visualization

Abstract

n-way combinatorial testing is a specification-based testing criterion, which requires that for a system consisting of a few parameters, every combination of valid values of arbitrary n (n ≥ 2) parameters be covered by at least one test. In this paper, we propose two different tests generation algorithms based on the combinatorial design for the n-way combination testing. We show that the produced tests can cover all the combinations of parameters to the greatest degree with the small quantity. We implemented the automatic test generators based on the algorithms and obtained some valuable empirical results.