Regression test suite reduction using extended dependence analysis

Authors:
Yanping Chen;Robert L. Probert;Hasan Ural
Affiliations:
University of Ottawa, Ottawa, Ontario, Canada;University of Ottawa, Ottawa, Ontario, Canada;University of Ottawa, Ottawa, Ontario, Canada
Venue:
Fourth international workshop on Software quality assurance: in conjunction with the 6th ESEC/FSE joint meeting
Year:
2007

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Abstract

A model-based regression test suite (RTS) reduction method based on Extended Finite State Machine (EFSM) dependence analysis is proposed. Given an EFSM representing the requirements of a system under test (SUT) and a set of elementary modifications (EMs) on the EFSM, interaction patterns are identified related to each type of EMs, i.e., adding, deleting, and changing transitions in the EFSM. These interaction patterns capture the effects of the model on the EMs, the effects of the EMs on the model, and the side-effects of the EMs. The proposed method reduces the size of a given RTS by examining interaction patterns covered by each test case in the given RTS.