A mean field model for a class of garbage collection algorithms in flash-based solid state drives
Proceedings of the ACM SIGMETRICS/international conference on Measurement and modeling of computer systems
Proceedings of the ACM SIGMETRICS/international conference on Measurement and modeling of computer systems
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We introduce a particle process that models the evolution of page configurations in solid-state-drive (SSD) storage devices. These devices use integrated circuitry as memory to store data. Typically, pages (units of storage) are organized into blocks of a given size. Three operations are permitted: write, read, and clean. Rewrites are not allowed, i.e., a page has to be "cleaned" before the write operation can be repeated. While the read and write operations are permitted on individual pages, the clean operation can be executed on whole blocks only. Analysis of our particle process captures a key tradeoff in the operation of SSD's.