Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law---Johnson-noise secure key exchange

Authors:
Yessica Saez;Laszlo B. Kish;Robert Mingesz;Zoltan Gingl;Claes G. Granqvist
Affiliations:
Department of Electrical and Computer Engineering, Texas A&M University, College Station, USA 77843-3128;Department of Electrical and Computer Engineering, Texas A&M University, College Station, USA 77843-3128;Department of Technical Informatics, University of Szeged, Szeged, Hungary 6701;Department of Technical Informatics, University of Szeged, Szeged, Hungary 6701;Department of Engineering Sciences, The Ångström Laboratory, Uppsala University, Uppsala, Sweden 75121
Venue:
Journal of Computational Electronics
Year:
2014

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Abstract

We classify and analyze bit errors in the current measurement mode of the Kirchhoff-law---Johnson-noise (KLJN) key distribution. The error probability decays exponentially with increasing bit exchange period and fixed bandwidth, which is similar to the error probability decay in the voltage measurement mode. We also analyze the combination of voltage and current modes for error removal. In this combination method, the error probability is still an exponential function that decays with the duration of the bit exchange period, but it has superior fidelity to the former schemes.