Support Vector Machines for 3D Object Recognition
IEEE Transactions on Pattern Analysis and Machine Intelligence
The Earth Mover's Distance as a Metric for Image Retrieval
International Journal of Computer Vision
Contour and Texture Analysis for Image Segmentation
International Journal of Computer Vision
Representing and Recognizing the Visual Appearance of Materials using Three-dimensional Textons
International Journal of Computer Vision
Multiresolution Gray-Scale and Rotation Invariant Texture Classification with Local Binary Patterns
IEEE Transactions on Pattern Analysis and Machine Intelligence
Classifying Images of Materials: Achieving Viewpoint and Illumination Independence
ECCV '02 Proceedings of the 7th European Conference on Computer Vision-Part III
Gray Scale and Rotation Invariant Texture Classification with Local Binary Patterns
ECCV '00 Proceedings of the 6th European Conference on Computer Vision-Part I
Histogram Model for 3D Textures
CVPR '98 Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Combining Gradient and Albedo Data for Rotation Invariant Classification of 3D Surface Texture
ICCV '03 Proceedings of the Ninth IEEE International Conference on Computer Vision - Volume 2
Moment invariants for recognition under changing viewpoint and illumination
Computer Vision and Image Understanding - Special issue on color for image indexing and retrieval
International Journal of Computer Vision - Special Issue on Texture Analysis and Synthesis
A Sparse Texture Representation Using Local Affine Regions
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Projective Invariant for Textures
CVPR '06 Proceedings of the 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Volume 2
International Journal of Computer Vision
Viewpoint Invariant Texture Description Using Fractal Analysis
International Journal of Computer Vision
Rotation Invariant Image Description with Local Binary Pattern Histogram Fourier Features
SCIA '09 Proceedings of the 16th Scandinavian Conference on Image Analysis
Dominant local binary patterns for texture classification
IEEE Transactions on Image Processing
Classifying materials in the real world
Image and Vision Computing
A completed modeling of local binary pattern operator for texture classification
IEEE Transactions on Image Processing
Extended fractal analysis for texture classification and segmentation
IEEE Transactions on Image Processing
IEEE Transactions on Circuits and Systems for Video Technology
Scale-space texture description on SIFT-like textons
Computer Vision and Image Understanding
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In this paper, a statistical approach to static texture description is developed, which combines a local pattern coding strategy with a robust global descriptor to achieve highly discriminative power, invariance to photometric transformation and strong robustness against geometric changes. Built upon the local binary patterns that are encoded at multiple scales, a statistical descriptor, called pattern fractal spectrum, characterizes the self-similar behavior of the local pattern distributions by calculating fractal dimension on each type of pattern. Compared with other fractal-based approaches, the proposed descriptor is compact, highly distinctive and computationally efficient. We applied the descriptor to texture classification. Our method has demonstrated excellent performance in comparison with state-of-the-art approaches on four challenging benchmark datasets.