A parallel precorrected FFT based capacitance extraction program for signal integrity analysis

Authors:
N. R. Aluru;V. B. Nadkarni;J. White
Affiliations:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA;Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA;Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA
Venue:
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Year:
1996

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Abstract