Automatic netlist extraction for measurement-based characterization of off-chip interconnect

Authors:
Steven D. Corey;Andrew T. Yang
Affiliations:
Dept. of Electrical Engineering, University of Washington, Seattle, Washington;Dept. of Electrical Engineering, University of Washington, Seattle, Washington
Venue:
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Year:
1997

Citing 2
Cited 0

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Abstract

An approach is presented for modeling board level, package-level, and MCM substrate-level interconnect circuitry based an measured time domain refectometry data. The time-domain scattering parameters of a multiport system are used to extract a SPICE netlist which uses standard elements to match the behavior of the device up to a user-specified cutoff frequency. Linear or nonlinear circuits may be connected to the model ports, and the entire circuit simulated in a standard circuit simulator. Two-port and four-port example microstrip circuits are characterized, and the simulation results are compared with measured data. Delay, reflection transmission, and crosstalk are accurately modeled in each case.