Improved low-degree testing and its applications

  • Authors:
  • Sanjeev Arora;Madhu Sudan

  • Affiliations:
  • Princeton University;IBM T. J. Watson Research Center, P.O.Box 218, Yorktown Heights, NY

  • Venue:
  • STOC '97 Proceedings of the twenty-ninth annual ACM symposium on Theory of computing
  • Year:
  • 1997

Quantified Score

Hi-index 0.00

Visualization

Abstract