A sub-constant error-probability low-degree test, and a sub-constant error-probability PCP characterization of NP

  • Authors:
  • Ran Raz;Shmuel Safra

  • Affiliations:
  • Weizmann Inst., Israel;Tel-Aviv University, Israel

  • Venue:
  • STOC '97 Proceedings of the twenty-ninth annual ACM symposium on Theory of computing
  • Year:
  • 1997

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Abstract