Test quality and yield analysis using the DEFAM defect to fault mapper

• Authors:

• Dinesh D. Gaitonde;D. M. H. Walker

• Affiliations:

• Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA;Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA

• Venue:
• ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
• Year:
• 1993