A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

Authors:
Christopher Michael;Christopher Abel;C. S. Teng
Affiliations:
National Semiconductor, 2900 Semiconductor Drive, Santa Clara, CA;Department of Electrical Engineering, The Ohio State University, Columbus, OH;National Semiconductor, 2900 Semiconductor Drive, Santa Clara, CA
Venue:
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Year:
1993

Citing 2
Cited 2

Common principal components & related multivariate models

Common principal components & related multivariate models
Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

SiSMA: a statistical simulator for mismatch analysis of MOS ICs

Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations

Analog Integrated Circuits and Signal Processing

Quantified Score

Hi-index	0.00

Visualization

Abstract