Registration of Multiple Overlapping Range Images: Scenes Without Distinctive Features
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Method for Registration of 3-D Shapes
IEEE Transactions on Pattern Analysis and Machine Intelligence - Special issue on interpretation of 3-D scenes—part II
Matching 3-D Line Segments with Applications to Multiple-Object Motion Estimation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Algorithms for Matching 3D Line Sets
IEEE Transactions on Pattern Analysis and Machine Intelligence
Image and Vision Computing
An invariant, closed-from solution for matching sets of 3D lines
CVPR'04 Proceedings of the 2004 IEEE computer society conference on Computer vision and pattern recognition
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In this paper, we consider two sets of corresponding 3D line segments of equal length. We derive a closed-form solution for the coordinate transform (rotation and translation) that gives the best match between the two sets; best in the sense of a least-squares distance measure between the sets. We use these results as the basis to construct efficient algorithms for solving other problems in computer vision. Specifically, we address the problem of matching polygonal arcs, that is, the problem of finding a match between a short arc and a piece of a long arc.