Estimation and Compensation of Subpixel Edge Localization Error

Authors:
Federico Pedersini;Augusto Sarti;Stefano Tubaro
Affiliations:
Politecnico di Milano, Milan, Italy;Politecnico di Milano, Milan, Italy;Politecnico di Milano, Milan, Italy
Venue:
IEEE Transactions on Pattern Analysis and Machine Intelligence
Year:
1997

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Abstract

We propose and analyze a method for improving the performance of subpixel Edge Localization (EL) techniques through compensation of the systematic portion of the localization error. The method is based on the estimation of the EL characteristic through statistical analysis of a test image and is independent of the EL technique in use.