The Art of Electronics
A design-for-test structure for optimising analogue and mixed signal IC test
EDTC '95 Proceedings of the 1995 European conference on Design and Test
A Design for Testability Scheme for CMOS LC-Tank Voltage Controlled Oscillators
Journal of Electronic Testing: Theory and Applications
A Built-In Self-Test Scheme for Differential Ring Oscillators
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
| Hi-index | 0.00 |
A feasibility study of design-for-testability (DFT) of a voltagecontrolled crystal oscillator with built-in MOS switches to increase itsobservability and controllability is presented. The primary aim was toassess to what extent the operation of the circuit is changed when theswitches are introduced. The possibility of non-destructive localization offaulty components in the provided test modes and the temperature/frequencycharacteristics measurements are briefly described. Finally, on the basis ofthe presented experimental work, a design-for-test procedure for crystaloscillator circuits is summarized. The work was performed in a developmentphase of a voltage controlled temperature compensated crystaloscillator.