Efficient transient electrothermal simulation of CMOS VLSI circuits under electrical overstress

• Authors:

• Tong Li;Ching-Han Tsai;Sung-Mo Steve Kang

• Affiliations:

• Analysis Product Division, Avant! Corporation;Dept. of Electrical and Computer Engineering, Univ. of Illinois at Urbana-Champaign;Dept. of Electrical and Computer Engineering, Univ. of Illinois at Urbana-Champaign

• Venue:
• Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
• Year:
• 1998