Transient simulation of lossy interconnect

  • Authors:
  • S. Lin;E. S. Kuh

  • Affiliations:
  • Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA;Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA

  • Venue:
  • DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
  • Year:
  • 1992

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Abstract