A Method to Detect and Characterize Ellipses Using the Hough Transform

  • Authors:
  • Nick Bennett;Robert Burridge;Naoki Salto

  • Affiliations:
  • Schlumberger-Doll Research, Ridgefield, CT;Schlumberger-Doll Research, Ridgefield, CT;Univ. of California at Davis, Davis

  • Venue:
  • IEEE Transactions on Pattern Analysis and Machine Intelligence
  • Year:
  • 1999

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Abstract

Web Extra:Download software mentionedinarticleIn this paper we describe a new technique for detecting and characterizing ellipsoidal shapes automatically from any type of image. This technique is a single pass algorithm which can extract any group of ellipse parameters or characteristics which can be computed from those parameters without having to detect all five parameters for each ellipsoidal shape. Moreover, the method can explicitly incorporate any a priori knowledge the user may have concerning ellipse parameters. The method is based on techniques from Projective Geometry and on the Hough Transform. This technique can significantly reduce interpretation and computation time by automatically extracting only those features or geometric parameters of interest from images and making exact use of a priori information.