Self-testing with correlated faults

Authors:
David R. Tryon
Affiliations:
International Business Machines Corporation, Tokyo System Evaluation Laboratory, 3-5, Nihonbashi-Honcho, Chuo-ku, Tokyo 103, Japan
Venue:
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Year:
1986

Citing 1
Cited 1

Statistical failure analysis of system timing

IBM Journal of Research and Development

On computing optimized input probabilities for random tests

DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference

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Abstract

Accurate prediction of the number of self-test random patterns that will provide low defect levels is crucial. This prediction is complicated by fault-to-fault correlating effects. This paper presents a technique to assess the number of random patterns required to test to a given defect level in the presence of fault correlation. This paper will also develop approximation algorithms that enable test engineers to readily compute defect levels as a function of test coverage with correlated faults present. This paper thus enhances previous work which assumed fault-to-fault independence in determining random pattern sufficiency and defect levels.