Diagnosis in hybrid fault situations under AIM and a unified t-characterization

• Authors:

• A. K. Somani;V. K. Agarwal

• Affiliations:

• Univ. of Washington, Seattle;McGill Univ., Montre´al, Que´bec, Canada

• Venue:
• Computers and Mathematics with Applications - Diagnosis and reliable design of VLSI systems
• Year:
• 1987