On the Complexity of Single Fault Set Diagnosability and Diagnosis Problems

  • Authors:
  • A. K. Somani;V. K. Agarwal;D. Avis

  • Affiliations:
  • Univ. of Washington, Seattle;McGill Univ., Montreal, Canada;McGill Univ., Montreal, Canada

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1989

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Abstract

The complexity of the single-fault (SF) set diagnosability and SF-diagnosis problems under the symmetric invalidation models is discussed. It is shown that the SF-diagnosis problem under both these models is co-NP-complete and the SF-diagnosability problem is also co-NP-complete under the asymmetric invalidation model. The SF-diagnosability problem is also studied under the symmetric-invalidation model and a polynomial time-complexity algorithm is presented. These results are in contrast with the corresponding t-diagnosability and t-diagnosis problems, which are known to have polynomial time-complexity algorithms.