Stochastic modeling and performance evaluation for digital clock and data recovery circuits

  • Authors:
  • Alper Demir;Peter Feldmann

  • Affiliations:
  • Bell Laboratories, Murray Hill, New Jersey;Bell Laboratories, Murray Hill, New Jersey

  • Venue:
  • DATE '00 Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2000

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Abstract