Alex Niemegeers;Gjalt de Jong
Alcatel SRD, F. Wellesplein 1, B-2018 Antwerp, Belgium;Alcatel SRD, F. Wellesplein 1, B-2018 Antwerp, Belgium
TOWARDS A UNIFIED TEST PROCESS: FROM UML TO END-OF-LINE FUNCTIONAL TEST
ITC '01 Proceedings of the 2001 IEEE International Test Conference