Random Jitter Extraction Technique in a Multi-Gigahertz Signal
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A Scalable On-Chip Jitter Extraction Technique
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Jitter spectral extraction for multi-gigahertz signal
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
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The authors describe how, in order to overcome timing jitter-the nemesis of high-speed design engineers-its source must be known. They detail how, to divine its source, thousands of signal observations must be collected and scrutinized to uncover flaws